我們的優(yōu)勢是歐美進(jìn)口備件配件，所有進(jìn)口的冷門的停產(chǎn)的或者你們找不到

的產(chǎn)品都可以來找我！

美國西門子ITE全系列、EATON電機(jī) 斷路器  接觸器 變壓器 、 GE電氣 斷路

器 接觸器 變壓器 、 Cutler-Hammer（卡特拉-漢莫）、艾默生電機(jī)、PQ、

VERSA  這些品牌我們價(jià)格都很美好。

歡迎前來詢價(jià)！


廈門紀(jì)揚(yáng)科技有限公司是一家以工業(yè)自動化為主營，融科、工、貿(mào)于一體，

專業(yè)從*工業(yè)自動化工程項(xiàng)目設(shè)計(jì)、安裝、調(diào)試等服務(wù)和*銷售各類進(jìn)口**

電氣及自動化產(chǎn)品的民營高新技術(shù)企業(yè)。綜合型的工程技術(shù)服務(wù)型單位，是

國內(nèi)專業(yè)的電氣產(chǎn)品分銷商及工業(yè)自動化系統(tǒng)集成商。









主營：世界知名品牌的PLC 、DCS 系統(tǒng)備件 模塊

①Allen-Bradley(美國AB)系列產(chǎn)品》

②Schneider(施耐德電氣)系列產(chǎn)品》

③General electric(通用電氣)系列產(chǎn)品》

④Westinghouse（美國西屋）系列產(chǎn)品》

⑤SIEMENS(西門子系列產(chǎn)品)》

⑥銷售ABB Robots. FANUC Robots、YASKAWA Robots、KUKA Robots、Mitsubishi Robots、OTC Robots、Panasonic Robots、MOTOMAN Robots。

⑦estinghouse（西屋）： OVATION系統(tǒng)、WDPF系統(tǒng)、MAX1000系統(tǒng)備件。

⑧Invensys Foxboro（福克斯波羅）：I/A Series系統(tǒng)，F(xiàn)BM（現(xiàn)場輸入/輸出模塊）順序控制、梯形 邏輯控制、事故追憶處理、數(shù)模轉(zhuǎn)換、輸入/輸出信號處理、數(shù)據(jù)通信及處理等。Invensys Triconex: 冗余容錯(cuò)控制系統(tǒng)、基于三重模件冗余（TMR）結(jié)構(gòu)的zui現(xiàn)代化的容錯(cuò)控制器。

⑨Siemens(西門子)：Siemens MOORE， Siemens Simatic C1，Siemens數(shù)控系統(tǒng)等。

⑩Bosch Rexroth（博世力士樂）：Indramat，I/O模塊,PLC控制器,驅(qū)動模塊等。

◆Motorola（摩托羅拉）：MVME 162、MVME 167、MVME1772、MVME177等系列。

艾默生 3900-02-10 PH: SENSOR

 
* Baratron Gauge :
  CH#A 1Torr, CH#B 1Torr, CH#D 100Torr/10Torr
  Turbo Pump : CH#A, CH#B
  Dry Pump : QDP80 (CH#A, CH#B, CH#D, L/L)
 

Vulcan Horizontal Furnace (H2-Aneal)
* Wafer Size : 150mm
* 1System 1Tube Anneal
* Loading Wafer Q’ty : 1~50 wafers (Process wafer) / 1Tube
* Electric Power : 380VAC 3phase 50/60Hz (R,S,T,G)
* Temperature Control Zone : 3Zone Control
* Process Temperature : 400~500℃, ±0.5℃
* Temp Control Mode : Spike & Profile T/C Select Control Mode
* Spike Thermo Couple Type : “R”-Type
* Max Temp Up Rate : 25℃/min
* Max Temp Down Rate : 3~7℃/min
* Over Temp Detection : Max 700℃, All Zone Excess Temp Detection

 

OP2600 Film Thickness monitor
* The Therma-Wave Opti-Probe 2600 is   for measurement of a wide range of optical beters such as film thickness of multiple layers and index of refrb.
* Compatible with wafers ranging from 4- to 8-inches, the system has two cassette loader stations.
* The Opti-Probe supports Beam Profile Reflectrometry (BPR) and Beam Profile Ellipsometry (BPE) modes.
* A 675nm thermoelectrically cooled diode laser is   to establish the optical beter and in spectrometry mode a visible 450 to 840 nm tungsten halogen lamp it  .
* Supports the full range of thick and thin film, refractive indexes, extinction coefficient and reflectivity measurements
  Multi-layer and multi-beter measurements on thin ONO and OPO film stacks
* BPR (Beam Profile Reflectometry : thick dielectric films > 500A)
* BPE (Beam Profile Ellipsometry : thin dielectric films < 500A)
* Spectrometry (High Index films : C-Si, Poly-Si, A-Si)
 

S-9200 CD-SEM
* Resolution (nm) : 3 / Repeatability (nm) : 3
* Throughput (wafer/h) : 45 (in continuous measurement via recipe, under Hitachi standard test conditions)
* Wafer size (inch) 6, 8
* Principle of CD measurement : Cursor line profile measurement
* CD Measure Range : 0.1 to 2.0μm
* CD Measurement reproducibility : ±1% or 3nm (3 sigma), whichever larger
* Secondary electron image resolution : 3nm(at accelerating voltage of 0.8kV; with reference specimen for resolution measurement)
* Image magnification : SEM image; x500 to x300,000 (CD measurement
* Reproducibility guarantee range: x40,000 to x200,000, excluding effects of contamination or charge-up)
* Optical microscope image; About x110
 

Surfscan SFS-6220 Particle Counter
* Sizes, and counts defects down to 0.09 μm at an 80% capture rate.
  – Wafer Size : 4 – 8 inch.
  – Non-patterned surface Inspection System.
  – 0.1 Micron Defect Sensitivity (PSL STD).
  – 0.02 ppm Haze Sensitivity.
  –  2 ppm Haze Resolution.
  – Accuracy within 1%. / XY coordinates.
  – Lock Down accessories.
  – Defect Map and Histogram with Zoom
  – Haze Map and Histogram with Zoom
  – Argon Ion Laser (488nm)
  – 2D Signal Integration
 

RS75 Four Point Probe System
* Analyze sheet resistance data, on various conductive layers such as implants, diffusion, epi, CVD, bls, and bulk substrates
* Provides accurate and repeatable sheet resistance measurements, from 5 m ohm/sq to 5M ohm/sq on 2-inch to 8-inch wafers, by uniting sophisticated modeling algorithms, advanced analysis techniques, and precision electronics.
  – Model: RS-75 / Four Point Probe System / Up to 200 mm wafers